GE’s XRF Positive Material Identification (PMI) are no longer available for sale. This page exists to provide technical documentation and reference materials for ongoing service and support of the product line.
Features and Benefits
- Fast, accurate analysis of common and advanced materials and alloys
- Ability to detect light elements (Mg, Al, Si, P, S) using it’s Silica Drift Detector (SDD) & 50kV tube
- For rapid inspection, the speed of the XL-PMI+ combined with the ability to utilize a tilting, color, & touch-screen display makes for a enjoyable operator experience
- Integrated camera is standard for accurate sample positioning and image capture
- Optional 3mm “small-spot” feature isolates welds, small samples and critical areas
- Detect & measure trace elements for FAC modeling (low Cr levels)
- Analyze components for residual/”tramp” elements in HF alkylation units or carbon steel assets
- Ease of reporting or sharing data using NDT software via USB or Bluetooth connection
– See more at: www.gemeasurement.com